ZEISS is introducing a new integrated system for serial block-face imaging

Scanning electron microscopy (SEM) in general can be used to explore intricate, ultrastructural 3D information with various methods collectively known as volume EM (vEM). Serial block-face SEM (SBF-SEM) is the vEM technology of choice for researchers who prefer easy sample preparation in combination with a highly automated imaging process enabling the acquisition of large volume … Read more